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1 electron-beam semiconductor device
Англо-русский словарь промышленной и научной лексики > electron-beam semiconductor device
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2 electron beam ionization of semiconductor device
Engineering: EBISDУниверсальный русско-английский словарь > electron beam ionization of semiconductor device
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3 прибор на полупроводниковом диоде с управлением электронным лучом
1) Engineering: electron bombarded semiconductor, electron-bombarded semiconductor deviceУниверсальный русско-английский словарь > прибор на полупроводниковом диоде с управлением электронным лучом
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4 прибор на полупроводниковом диоде с управлением электронным
Electronics: EBS device, electron-beam-semiconductor deviceУниверсальный русско-английский словарь > прибор на полупроводниковом диоде с управлением электронным
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5 EBISD
Англо-русский словарь промышленной и научной лексики > EBISD
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6 электронно-лучевая ионизация полупроводникового прибора
Engineering: electron beam ionization of semiconductor deviceУниверсальный русско-английский словарь > электронно-лучевая ионизация полупроводникового прибора
См. также в других словарях:
Electron beam induced current — (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is used to identify buried junctions or defects in semiconductors, or to examine minority… … Wikipedia
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electron tube — an electronic device that consists, typically, of a sealed glass bulb containing two or more electrodes: used to generate, amplify, and rectify electric oscillations and alternating currents. Also called electronic tube. Cf. gas tube, vacuum tube … Universalium
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Électron — Traduction à relire Electron → … Wikipédia en Français
Transmission electron microscopy — A TEM image of the polio virus. The polio virus is 30 nm in size.[1] Transmission electron microscopy (TEM) is a microscopy technique whereby a beam of electrons is transmitted through an ultra thin specimen, interacting with the specimen as it… … Wikipedia
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Focused ion beam — Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor and materials science fields for site specific analysis, deposition, and ablation of materials. The FIB is a scientific instrument that resembles a… … Wikipedia